Scanning force microscopy study of patterned monolayers of alkanethiols on gold. Importance of tip-sample contact area in interpreting force modulation and friction force microscopy images G. Bar, S. Rubin, A. N. Parikh, B. I. Swanson, T. A. Zawodzinski, M. H. Whangbo, Langmuir 13, 373 (1997) 1996-2000
Nanometer-scale phase separation in mixed composition self-assembled monolayers S. J. Stranick, S. V. Atre, A. N. Parikh, M. C. Wood, D. L. Allara, N. Winograd, P. S. Weiss, Nanotechnology 7, 438 (1996) 1996-2000
Tribology studies of organic thin films by scanning force microscopy G. Bar, S. Rubin, A. Parikh, B. Swanson, T. Zawodzinski, MRS Proceedings: Thin Films Stresses and Mechanical Properties VI 436, 269 (1996) 1996-2000
Electron-beam-induced damage in self-assembled monolayers Kannan Seshadri, Karl Froyd, Atul N. Parikh, David L. Allara, Michael J. Lercel, Harold G. Craighead, Journal of Physical Chemistry 100, 15900 (1996) 1996-2000
Sub-10 nm lithography with self-assembled monolayers M. J. Lercel, H. G. Craighead, A. N. Parikh, K. Seshadri, D. L. Allara,Applied Physics Letters 68, 1504 (1996) 1996-2000
Plasma etching with self-assembled monolayer masks for nanostructure fabrication M. J. Lercel, H. G. Craighead, A. N. Parikh, K. Seshadri, D. L. Allara, Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films 14, 1844 (1996) 1996-2000